A SUITABLE CONTROL SCHEME FOR THE BINARY MULTIPLIER DATA BANK OF VLSI CAD

Authors

  • O. I. Tymoshkin Rostov Academy of service of South Russian state University of Economics and service, Russian Federation, Ukraine

DOI:

https://doi.org/10.15802/stp2009/13620

Keywords:

testability scheme, binary multiplier, database

Abstract

Problem of elaborating a databank of testable digital elements, units and modules, which are most typical for digital systems, is considered. For this bank an original testable logical circuit of matrix binary multiplier, demanding small amount of hardware for its realization, is proposed.

Author Biography

O. I. Tymoshkin, Rostov Academy of service of South Russian state University of Economics and service, Russian Federation

O. I. Tymoshkin

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Published

2009-10-25

How to Cite

Tymoshkin, O. I. (2009). A SUITABLE CONTROL SCHEME FOR THE BINARY MULTIPLIER DATA BANK OF VLSI CAD. Science and Transport Progress, (29), 140–142. https://doi.org/10.15802/stp2009/13620

Issue

No. 29 (2009): ISSUE 29

Section

AUTOMATED AND TELEMATIC SYSTEMS ON TRANSPORT

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