KIM, E. D.; TARAN, V. M.; SYCHENKO, V. H. THE OPERATIONAL RELIABILITY OF THE DISC OF PORCELAIN INSULATORS THE CONTACT NETWORK. PREDICTION RESIDUAL LIFETIME. Science and Transport Progress , [S. l.], n. 13, p. 33–35, 2006. DOI: 10.15802/stp2006/18237. Disponível em: https://stp.ust.edu.ua/article/view/18237. Acesso em: 2 may. 2024.